200 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz
200 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz
Buyer
IHP GmbH - Leibniz-Institut für innovative Mikroelektronik
Value
€189,900
Published
7 Oct 2026
Closes
Not provided
Procurement details
Source
TED (EU)
Country
Germany (DE)
Procurement method
Open
Category
Goods
Contract starts
Not provided
Contract ends
Not provided
CPV classifications
38341300
Instruments for measuring electrical quantities
38540000
Machines and apparatus for testing and measuring
Lots
Lot LOT-0001 200 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz
€189,900
- Semi-automated 200 mm probe system for on-wafer measurements - Integrated controlled dry atmosphere to prevent condensation and ice formation during measurements below ambient temperature - System design with a defined interface architecture enabling integration of optional thermal chucks through standardized mechanical, electrical, and software interfaces...
Delivery: Frankfurt (Oder) · DE403 · Germany
Documents
Unlock document linkTED notice 690612-2026
7 Oct 2026
Award notice · Web page
Contains information from TED (Tenders Electronic Daily), © European Union, reused under CC BY 4.0.