FIB & SEM system (HHI-01) - PR1216644-3220-P
FIB & SEM system (HHI-01)
Buyer
Fraunhofer-Gesellschaft, Einkauf B12
Value
Not provided
Published
20 Jul 2026
Closes
17 Aug 2026
Procurement details
Source
TED (EU)
Region
DE300
Procurement method
Selective
Category
Goods
Contract starts
Not provided
Contract ends
Not provided
CPV classifications
42900000
Miscellaneous general and special-purpose machinery
38512100
Ion microscopes
Lots
Lot LOT-0000 FIB & SEM system (HHI-01) - PR1216644-3220-P
Value not provided
1 FIB-SEM dual-beam system As part of the procurement process, a field-free (without immersion optics) focused ion beam system (FIB-SEM) combined with a high-resolution scanning electron microscope (SEM) is to be selected. The system will be used for patterning, nanostructuring, and cross-sectional and surface analysis of primarily III/V semiconductors, LNOI...
Delivery: Berlin · DE300 · Germany
Documents
Unlock document linkTED notice 500145-2026
20 Jul 2026
Tender notice · Web page
Procurement documents
Not provided
Bidding documents
TED notice 506216-2026
22 Jul 2026
Tender notice · Web page
TED notice 532092-2026
31 Jul 2026
Tender notice · Web page
Contains information from TED (Tenders Electronic Daily), © European Union, reused under CC BY 4.0.