200 mm Wafer Prober incl. Temperature Testing (IIS-05.1) - PR1227015-2440-P
200 mm Wafer Prober incl. Temperature Testing (IIS-05.1)
Buyer
Fraunhofer-Gesellschaft, Einkauf B12
Value
Not provided
Published
6 Aug 2026
Closes
7 Sept 2026
Procurement details
Source
TED (EU)
Region
DE252
Procurement method
Open
Category
Goods
Contract starts
Not provided
Contract ends
Not provided
CPV classifications
38552000
Electronic meters
Lots
Lot LOT-0000 200 mm Wafer Prober incl. Temperature Testing (IIS-05.1) - PR1227015-2440-P
Value not provided
1 Piece 200 mm Wafer Prober incl. Temperature Testing (IIS-05.1) This specification describes the requirements for one wafer probing system to be used for characterization and test engineering for sensor ICs and chiplets at the Fraunhofer IIS. The system must allow handling of 200 mm and 300 mm wafers and 300 mm dicing frames. The focus in the usage of the m...
Delivery: Erlangen · DE252 · Germany
Documents
Unlock document linkTED notice 543721-2026
6 Aug 2026
Tender notice · Web page
Procurement documents
Not provided
Bidding documents
TED notice 686113-2026
6 Oct 2026
Award notice · Web page
Contains public sector information licensed under the Open Government Licence v3.0.