Scanning electron microscope for imaging and quantitative analysis in geological samples

The Institute of Geochemistry and Petrology at ETH Zürich is seeking to upgrade its existing analytical scanning electron microscope (SEM) for a new SEM equipped with a field emission gun, secondary electrons detector (SE) and high-performance backscattered electron detectors (BSE), and a state-of-the-art large area (≥ 100 mm2) energy dispersive spectrometer (EDS). Among several options, we welcome offers for panchromatic and/or entry-level monochromatic cathodoluminescence detector. The main goal of this instrumen...