Kelvin probe force microscopy (KPFM)

The object of the tender process was a Kelvin probe force microscopy (KPFM) equipped with atomic force microscopy (AFM) functionality, a state-of-the-art detector system, and equipment for advanced material surface potential mapping with an efficient spatial resolution and a minimum of topographical artifacts (later also “Equipment”). The equipment supports both AM- and FM-KPFM modes, operate with a potential range up to ±10 V, with a reasonable spatial resolution. The applied voltage is from a few hundred millivol...