Rasterelektronenmikroskop - PR1253394-2790-W
Rasterelektronenmikroskop
Buyer
Fraunhofer-Gesellschaft, Einkauf B12
Value
Not provided
Published
5 Aug 2026
Closes
7 Sept 2026
Procurement details
Source
TED (EU)
Region
DE252
Procurement method
Selective
Category
Goods
Contract starts
Not provided
Contract ends
Not provided
CPV classifications
38511100
Scanning electron microscopes
Lots
Lot LOT-0000 Rasterelektronenmikroskop - PR1253394-2790-W
Value not provided
1 Piece Scanning electron microscopy (SEM) is a widely used analytical tool for materials analysis, combining non-destructive, user-friendly operation with extensive possibilities for materials characterisation. In addition to imaging of material surfaces, SEM enables a variety of spectroscopic and diffraction-based methods for analysing chemical composition...
Delivery: Erlangen · DE252 · Germany
Documents
Unlock document linkTED notice 540796-2026
5 Aug 2026
Tender notice · Web page
Procurement documents
Not provided
Bidding documents
Contains public sector information licensed under the Open Government Licence v3.0.