Awarded Contractocds-r6ebe6-0000678412

NMS - Variable Pressure Field Emission Gun Scanning Electron Microscope with Analytical Detectors & Specimen Coater

This tender seeks to procure a Variable Pressure Field-Emission Gun Scanning Electron Microscope (VP FEG-SEM) and a range of analytical detectors (CL, EDX, WDS, EBDSD) and specimen coater (C/Pt) to enable high-resolution imaging and analysis which can be used in concert at the National Museums Collection Centre in Edinburgh to study a wide range of collections.

Buyer

National Museums Scotland

Value

Not provided

Published

5 Jan 2022

Closes

11 Feb 2022

Procurement details

Source

Pcs

Region

United Kingdom

Procurement method

Open

Category

Goods

Contract starts

Not provided

Contract ends

Not provided

CPV classifications

38511100

Scanning electron microscopes

Lots

Lot 1 VARIABLE PRESSURE FIELD-EMISSION GUN SEM (VP FEG-SEM)

Value not provided

Please see attached tender documentation for full details.. Please see the tender documents uploaded to this notice for full details.

Delivery: UKM75

Lot 3 A) TRANSFER OF EXISTING EDX SYSTEM & SOFTWARE UPGRADE; OR B) A NEW EDX SYSTEM; AS WELL AS A WAVELENGTH DISPERSIVE X-RAY SPECTROMETER AND ELECTRON BACKSCATTER DI...

Value not provided

Please see attached tender documentation for full details.. Please see tender documents attached to this notice for full details.

Delivery: UKM75

Lot 4 SPECIMEN COATER (C/Pt)

Value not provided

Please see attached tender documentation for full details.. Please see tender documents uploaded to this notice for full details.

Delivery: UKM75

Lot 2 RGB/COLOUR CATHODOLUMINESCENCE DETECTOR (CL)

Value not provided

Please see attached tender documentation for full details.. Please see the tender documents uploaded to this notice for full details.

Delivery: UKM75

NMS - Variable Pressure Field Emission Gun Scanning Electron Microscope with Analytical Detectors & Specimen Coater

Not provided

This tender seeks to procure a Variable Pressure Field-Emission Gun Scanning Electron Microscope (VP FEG-SEM) and a range of analytical detectors (CL, EDX, WDS, EBDSD) and specimen coater (C/Pt) to enable high-resolution imaging and analysi...

Contract notice · Web page

Schedule 1_Analytical SEM_ITT Instructions To Tenderers (inc App A)

5 Jan 2022

Word document

Schedule 2_Analytical SEM_Procurement Specification and Tenderers Submission

5 Jan 2022

Word document

Schedule 3_Analytical SEM_Pricing Document

5 Jan 2022

Excel spreadsheet

Schedule 4_NMS Terms and Conditions

5 Jan 2022

PDF

Schedule 2_10Jan2022_Analytical SEM_Specification and Tenderers Submission_clarification to spec.

10 Jan 2022

Word document

NMS - Variable Pressure Field Emission Gun Scanning Electron Microscope with Analytical Detectors & Specimen Coater

Not provided

Award notice · Web page

Contains public sector information licensed under the Open Government Licence v3.0.