Open Tenderocds-r6ebe6-0000507128

Cryo-Focused Ion Beam/Scanning Electron Microscope with EDX/EBSD Detectors

University of Edinburgh invites competitive tenders for the supply of a Focused Ion Beam/Scanning Electron Microscope with EDX Detector, Cryo-Stage and TEM Cryo Transfer. Bidders must self-certify their adherence to selection and exclusion criteria via the ESPD (Scotland) on PCS-T.Suppliers may be required to submit Means of Proof at a later stage. When completing the ESPD, bidders musthave regard for the specific selection requirements detailed in Sections III of this OJEU Notice.

Buyer

University Of Edinburgh

Value

£1,300,000

Published

9 Aug 2017

Closes

11 Sept 2017

Procurement details

Source

Pcs

Region

United Kingdom

Procurement method

Open

Category

Goods

Contract starts

Not provided

Contract ends

Not provided

CPV classifications

38512100

Ion microscopes

38511100

Scanning electron microscopes

33165000

Cryosurgical and cryotherapy devices

33114000

Spectroscopy devices

38530000

Diffraction apparatus

Lots

Lot 1 FIB-SEM Microscope

Value not provided

This procurement is for supply, installation, initial training and technical services in relation to a cryogenic Dual-Beam Focused Ion Beam Scanning Electron microscope (cryo-FIB-SEM). We intend to procure this equipment in order to establish a multi-user facility focused on the 3D imaging of soft materials, hard materials, soft-hard composites and complex f...

Delivery: UKM75

Lot 3 Cryogenic Equipment

Value not provided

As per Lot 1. Economic operators may be excluded from this competition if there are any of the situations referred to inregulation 58 of the Public Contracts (Scotland) Regulations 2015.

Delivery: UKM75

Lot 2 Energy Dispersive X-ray spectroscopy (EDX) detector

Value not provided

As per Lot 1. Economic operators may be excluded from this competition if there are any of the situations referred to in regulation 58 of the Public Contracts (Scotland) Regulations 2015.

Delivery: UKM75

Lot 4 Electron BackScatter Diffraction (EBSD) system

Value not provided

As per Lot 1. Economic operators may be excluded from this competition if there are any of the situations referred to inregulation 58 of the Public Contracts (Scotland) Regulations 2015.

Delivery: UKM75

Cryo-Focused Ion Beam/Scanning Electron Microscope with EDX/EBSD Detectors

Not provided

University of Edinburgh invites competitive tenders for the supply of a Focused Ion Beam/Scanning Electron Microscope with EDX Detector, Cryo-Stage and TEM Cryo Transfer. Bidders must self-certify their adherence to selection and exclusion...

Contract notice · Web page

Contains public sector information licensed under the Open Government Licence v3.0.