Tabletop metrology SEM
A tabletop scanning electron microscope (SEM) is required for the characterisation and metrology of samples during fabrication within the ICS cleanroom. This tool is integral for the development control of semiconductor device processing and would allow for the standardisation of various techniques within the cleanroom. A tabletop SEM would be utilised in the imaging of device structures where a standard optical microscope would not be suitable. Optical microscopes are fundamentally restricted to resolve to minimum...
Buyer
CARDIFF UNIVERSITY
Value
Not provided
Published
21 Oct 2022
Closes
21 Oct 2022
Procurement details
Source
Sell2Wales
Region
Cardiff and Vale of Glamorgan
Procurement method
Not provided
Category
Goods
Contract starts
Not provided
Contract ends
Not provided
CPV classifications
No CPV codes are available for this public record.
Lots
Lot default Tabletop metrology SEM
Value not provided
A tabletop scanning electron microscope (SEM) is required for the characterisation and metrology of samples during fabrication within the ICS cleanroom. This tool is integral for the development control of semiconductor device processing and would allow for the standardisation of various techniques within the cleanroom. A tabletop SEM would be utilised in th...
Documents
No document metadata is available for this public record.
Contains public sector information licensed under the Open Government Licence v3.0.