Wide-Bandgap Dynamic Reliability & Robustness Power Characterisation Tester

The University of Warwick has a requirement to purchase a Dynamic Reliability & Robustness Power Characterisation Tester designed for testing wide bandgap (SiC and GaN) power semiconductor device. In order to express interest in this opportunity please go to the University of Warwick In-Tend supplier portal (https://in-tendhost.co.uk/universityofwarwick). The University of Warwick is not a contracting authority for the purposes of the Public Contracts Regulations 2015 (as amended) or the Procurement Act 2023 and as...