NMS - Variable Pressure Field Emission Gun Scanning Electron Microscope with Analytical Detectors & Specimen Coater
This tender seeks to procure a Variable Pressure Field-Emission Gun Scanning Electron Microscope (VP FEG-SEM) and a range of analytical detectors (CL, EDX, WDS, EBDSD) and specimen coater (C/Pt) to enable high-resolution imaging and analysis which can be used in concert at the National Museums Collection Centre in Edinburgh to study a wide range of collections.
Buyer
National Museums Scotland
Value
Not provided
Published
7 Jun 2022
Closes
11 Feb 2022
Procurement details
Source
Find a Tender
Region
Scotland
Procurement method
Open
Category
Goods
Contract starts
Not provided
Contract ends
Not provided
CPV classifications
38511100
Scanning electron microscopes
Lots
Lot 1 VARIABLE PRESSURE FIELD-EMISSION GUN SEM (VP FEG-SEM)
Value not provided
Please see attached tender documentation for full details. Additional information: Please see the tender documents uploaded to this notice for full details.
Delivery: UKM75
Lot 3 A) TRANSFER OF EXISTING EDX SYSTEM & SOFTWARE UPGRADE; OR B) A NEW EDX SYSTEM; AS WELL AS A WAVELENGTH DISPERSIVE X-RAY SPECTROMETER AND ELECTRON BACKSCATTER DI...
Value not provided
Please see attached tender documentation for full details. Additional information: Please see tender documents attached to this notice for full details.
Delivery: UKM75
Lot 4 SPECIMEN COATER (C/Pt)
Value not provided
Please see attached tender documentation for full details. Additional information: Please see tender documents uploaded to this notice for full details.
Delivery: UKM75
Lot 2 RGB/COLOUR CATHODOLUMINESCENCE DETECTOR (CL)
Value not provided
Please see attached tender documentation for full details. Additional information: Please see the tender documents uploaded to this notice for full details.
Delivery: UKM75
Documents
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