1966/JN - Scanning Electron Microscope

The University of Sheffield requires a new desktop scanning electron microscope (SEM) to support its research in semiconductor devices. It will be used for detailed inspection and measurement of micro and nano scale structures fabricated on InP and GaAs substrates incorporating metallic and glass thin films, at various stages during the fabrication process, often with high throughput required. The full specification and ITT can be downloaded by registering and expressing your interest on the University`s e-tenderin...