Supply, Installation and Commissioning of an Atomic Force Microscope

The Centre for Process Innovation Ltd (CPI) requires the following; Atomic Force Microscopy (AFM) is a surface profiling technique which allows the topography of nanostructured surfaces to be mapped. Primarily AFMs are used for surface profiling and particle sizing however a series of secondary modes can provide maps of electrical conductivity, surface potentials and mechanical properties. As such a large sample area AFM will form an important characterization tool for the CPI's graphene centre where materials late...