E/2797 - Ellipsometer

The University of Leeds is seeking tenders for an ex situ (standalone) spectroscopic ellipsometer. The system will be used for research and should offer flexibility of use, having the ability to measure the properties of thin-films (including isotropic and anisotropic single films and multiple layer stacks) deposited on Si, GaAs and quartz substrates amongst others. The system must be capable of measuring the thickness (and other optical properties) of: o ALD-deposited oxides and nitrides of: Sn, Hf, Al, Ti amongst...