Advanced Analytical (Scanning) Transmission Electron Microscope ((S)TEM) optimised for structural and chemical characterisation of beam sensitive materials

The University of Manchester is looking to acquire an advanced analytical (scanning) transmission electron microscope ((S)TEM) optimised for structural and chemical characterisation of beam sensitive materials. Currently TEM is used extensively in the study of inorganic materials which often exhibit good thermal and electrical conductivity or highly stable bonding and structure, making them able to withstand the high energy density experienced in focussed electron beams and several hundred kilovolt acceleration. Th...