GB-Newcastle upon Tyne: T23/0029 - Focused Ion Beam Secondary Electron Microscope (FIB-SEM)

NOTE: This notice was updated on 23 November 2023 for the following reason: Please note that the deadline for submissions has been extended to Friday, December 1st, 2023.(The university is looking to purchase a focused ion beam secondary electron microscope (FIB-SEM) that can handle various samples from different fields including semiconductors, energy materials (such as batteries and photovoltaics), civil engineering, metallurgy, etc. The instrument must excel in analysing thin film multilayer structures and devic...