High-Voltage Semiconductor Probing System and Parameter Analyser System

The University of Warwick has a requirement to update its high voltage characterisation facility comprising a parameter analyser and probe station (prober). The combined facility will be capable of making current-voltage (I-V) and capacitance-voltage (C-V) measurements on power semiconductor devices made in house, both on-wafer (or on-chip) through the use of the prober, and packaged. This tender is split into two separate lots; o Lot 1 - High-Voltage Semiconductor Probing System (Prober) o Lot 2 - High-Voltage Par...