Ellipsometer

This ERC-funded project led by Prof. Bill Barnes concerns the interaction of light with nanostructured materials. A key part of the project is to measure the optical properties of a range of materials, primarily in the form of thin films on glass or semiconducting substrates. Substrates will typically be 1 mm thick, and approx. 10 - 25 mm square, although other sizes may be used. Film thicknesses will be typically in the range 5 nm - 5 microns. The films to be investigated range from reflective metals such as gold...