I06 Aberration Corrected PEEM/LEEM Microscope
Our technical specification details the requirements of the Aberration Corrected PhotoEmission Electron Microscope (AC-PEEM) and Low Energy Electron Microscope (AC-LEEM) for use on the Nanoscience beamline at DLS. The microscope will be installed on the nanoscience I06 beamline that is dedicated to the study of nanomagnetism and nanostructures using element specific probes such as X-Ray absorption spectroscopy and X-Ray photoelectron spectroscopy. The variable polarisation state of the x-ray light provides a contra...
Buyer
Diamond Light Source Ltd
Value
£1,077,585
Published
11 Feb 2019
Closes
8 Jan 2019
Procurement details
Source
Contracts Finder
Region
United Kingdom
Procurement method
Open
Category
Goods
Contract starts
23 Jan 2019
Contract ends
20 Jul 2020
CPV classifications
38510000
Microscopes
Lots
Lot default I06 Aberration Corrected PEEM/LEEM Microscope
£1,077,585
Our technical specification details the requirements of the Aberration Corrected PhotoEmission Electron Microscope (AC-PEEM) and Low Energy Electron Microscope (AC-LEEM) for use on the Nanoscience beamline at DLS. The microscope will be installed on the nanoscience I06 beamline that is dedicated to the study of nanomagnetism and nanostructures using element...
Documents
Unlock document linkOpportunity notice on Contracts Finder
5 Dec 2018
Opportunity notice on Contracts Finder
Tender notice · Web page
OJEU Notice
Not provided
OJEU Notice
Tender notice · PDF
Awarded contract notice on Contracts Finder
11 Feb 2019
Awarded contract notice on Contracts Finder
Award notice · Web page
Contains public sector information licensed under the Open Government Licence v3.0.